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The imaging performance of X-ray optics (expressed in terms of HEW, HalfEnergy-Width) can be severely affected by X-ray scattering caused by the surface roughness of the mirrors. The impact of X-ray scattering has an increasing relevance for increasing photon energy, and can be the dominant problem in a hard X-ray telescope like SIMBOLX. In this work we show how, by means of a novel formalism, we can derive a surface roughness tolerance – in terms of its power spectrum – from a specific HEW requirement for the SIMBOL-X optical module.